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使用MSO 5/6内置AWG进行功率半导体器件的双脉冲测试
双脉冲测试是一种行业标准技术,用于在被测器件 (DUT)的开启、关闭以及反向恢复过程中测量一系列重要参数。基本测试设置如图2所示。假设高侧和低侧使用相同的晶体管器件,高侧晶体管可以保持关闭状态,从而可以测量开关损耗和反向恢复损耗。为了确定电路中的DPT开关参数,需要观察低侧器件的 ...
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